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Volumn 50, Issue 11, 2002, Pages 3045-3055

Dislocation emission at junctions between Σ = 3 grain boundaries in gold thin films

Author keywords

Dislocations; Grain boundaries; Thin films; Transmission electron microscopy (TEM); Twin

Indexed keywords

DISLOCATIONS (CRYSTALS); GOLD; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; STRESS RELAXATION; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

EID: 0037189281     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(02)00133-7     Document Type: Article
Times cited : (14)

References (14)
  • 10
    • 0031355227 scopus 로고    scopus 로고
    • Yalisove S.M., Adams B.L., Im J.S., Zhu Y., Chen F.-R., editors. Polycrystalline thin films - structure, texture, properties and applications III, Pittsburgh, PA
    • (1997) Mat. Res. Soc. Symp. Proc. , vol.472 , pp. 113
    • King, A.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.