New highly divided Ce-Ca-based oxyfluorides with UV-shielding properties: Study of the Ce1-xCaxO2-x and Ce 1-xCaxO2-x-y/2Fy series

Chemistry of Materials

Volumn 19, Issue 21, 2007, Pages 5110-5121

  Sronek, L ^a   Majimel, J ^a   Kihn, Y ^b   Montardi, Y ^c   Tressaud, A ^a   Feist, M ^d   Legein, C ^e   Buzare J Y ^e   Body, M ^e   Demourgues, A ^a  

^a INST CHIM MATIERE COND BORDEAUX   (France)

^b CEMES CNRS   (France)

^c Rhodia Recherches   (France)

^d HUMBOLDT UNIVERSITY   (Germany)

^e UNIVERSITÉ DU MAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPRECIPITATION; ENERGY GAP; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PARTICLE SIZE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

FLUORINATING AGENT; OXYFLUORIDES; THOMPSON-COX-HASTING FUNCTION; UV SHIELDING;

FLUORINE COMPOUNDS;

EID: 35548950197     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm071482h     Document Type: Article

References (34)

1. Asahi, R.; Taga, Y.; Mannstadt, W.; Freeman, A. J. Phys. Rev. B 2000, 67, 7459-7465.
2. Sorantin, P. I.; Schwarz, K. Inorg. Chem. 1992, 31, 567-576.
3. Lindan, P. J. D.; Harrison, N. M.; Gillan, M. J.; White, J. A. Phys. Rev. B 1997, 55, 15919-15927.
4. Goniakowski, J.; Holender, J. M.; Kantorovich, L. N.; Gillan, M. J.; White, J. A. Phys. Rev. B 1996, 53, 957-960.
5. Karpina, V. A.; Lazorenko, V. I.; Lashkarev, C. V.; Dobrowolski, V. D.; Kopylova, L. I.; Baturin, V. A.; Pustovoytov, S. A.; Karpenko, A. J.; Eremin, S. A.; Lytvyn, P. M.; Ovsyannikov, V. P.; Mazurenko, E. A. Cryst. Res. Technol. 2004, 39, 980-992.
6. Skorodumova, N. V.; Ahuja, R.; Simak, S. I.; Abrikosov, I. A.; Johansson, B.; Lundqvist, B. I. Phys. Rev. B 2001, 64, 115108.
7. Rocquefelte, X.; Goubin, F.; Montardi, Y.; Viadère, N.; Demourgues, A.; Tressaud, A.; Whangbo, M.-H.; Jobic, S. Inorg. Chem. 2005, 44, 3589-3593.
8. Goubin, F.; Rocquefelte, X.; Whangbo, M.-H.; Montardi, Y.; Bree, R.; Jobic, S. Chem. Mater. 2004, 16, 662-669.
9. Hoffmann, M. R.; Martin, S. T.; Choi, W.; Bahnemann, D. W. Chem. Rev. 1995, 95, 69-96.
10. Fu, D. G.; Zhang, Y.; Wang, X.; Liu, J. Z.; Lu, Z. H. Chem. Lett. 2001, 328-329.
11. Trovarelli, A.; de Leitenburg, C.; Boaro, M.; Dolcetti, G. Catal. Today 1999, 50, 353-367.
12. Yamashita, M.; Kameyama, K.; Yabe, S.; Yoshida, S.; Fujishiro, Y.; Kawai, T.; Sato, T. J. Mater. Sci. 2002, 37, 683-687.
13. Yabe, S.; Sato, T. J. Solid State Chem. 2003, 171, 7-11.
14. Dagan, G.; Sampath, S.; Lev, O. Chem. Mater. 1995, 7, 446-453.
15. Takata, T.; Furumi, Y.; Shinohara, K.; Tanaka, A.; Hara, M.; Kondo, J. N.; Domen, K. Chem. Mater. 1997, 9, 1063-1064.
16. Li, R.; Yabe, S.; Yamashita, M.; Momose, S.; Yoshida, S.; Yin, S.; Sato, T. Solid State Ionics 2002, 151, 235-241.
17. Rodriguez, J. A.; Wang, X.; Hanson, J. C.; Liu, G.; Iglesias-Juez, A.; Fernandez-Garcia, M. J. Chem. Phys. 2003, 119, 5659-5669.
18. Kümmerle, E. A.; Heger. G. J. Solid State Chem. 1999, 147, 485-500.
19. Cheetham, A. K.; Fender, B. E. F.; Cooper, M. J. J. Phys. C.: Solid State Phys. 1971, 4, 3107-3121.
20. Le Bail, A.; Louër, D. J. Appl. Crystallogr. 1978, 11, 50-55.
21. Thompson, P.; Cox, D. E.; Hastings, J. B. J. Appl. Crystallogr. 1987, 20, 79-83.
22. Carjaval, J. R. FULLPROF Program, Rietveld Pattern Matching Analysis of Powder Patterns, ILL, Grenoble, 1990.
23. Massiot, D.; Fayon, F.; Capron, M.; King, I.; Le Calvé, S.; Alonso, B.; Durand, J. O.; Bujoli, B.; Gan, Z.; Hoatson, G. Magn. Reson. Chem. 2002, 40, 70-76.
24. Tolla, B.; Demourgues, A.; Isnard, O.; Menetrier, M.; Pouchard, M.; Rabardel, L.; Seguelong, T. J. Mater. Chem. 1999, 9, 3131-3136.
25. Ratnasamy, P.; Srinivas, D.; Satyanarayana, C. V. V.; Manikandan, P.; Kumaran, R. S. S.; Sachin, M.; Shetti, V. N. J. Catal. 2004, 221, 455-465.
26. Wolf, D.; Heber, M.; Grünert, W.; Muhler, M. J. Catal. 2001, 199, 92-106.
27. Shannon, R. D. Acta Crystallogr., Sect. A 1976, 32, 751-767.
28. Rodriguez-Carvajal, J.; Roisnel, T. Line broadening analysis using Fullprof. Materials Science Forum (European Powder Diffraction Conference; EPDIC8, Uppsala, 2002).
29. Caglioti, G.; Paoletti, A.; Ricci, F. P. Nucl. Instrum. Methods 1958, 3, 223-228.
30. Bérar, J. L.; Lelann, H. J. Appl. Crystallogr. 1991, 24, 1-5.
31. Ganguly, R.; Siruguri, V.; Gopalakrishnan, I. K.; Yakhmi, J. V. J. Phys.: Condens. Matter 2000, 12, 1683-1689.
32. Schmidt, R.; Müller, B. G. Z. Anorg. Allg. Chem. 1999, 625, 605-608.
33. Bureau, B.; Silly, G.; Buzaré, J.-Y.; Emery, J. Chem. Phys. 1999, 249, 89-104.
34. Legein, C.; Fayon, F.; Martineau, C.; Body, M.; Buzaré, J.-Y.; Massiot, D.; Durand, E.; Tressaud, A.; Demourgues, A.; Péron, O.; Boulard, B. Inorg. Chem. 2006, 45, 10636-10641.