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Volumn 40, Issue 21, 2007, Pages 7433-7436

Nanometer voids prevent crack growth in polymeric materials

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; COPOLYMERS; ELASTOMERS; POISSON RATIO; POLYMERS; POLYMETHYL METHACRYLATES; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

EID: 35548931625     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma071262p     Document Type: Article
Times cited : (12)

References (17)
  • 1
    • 0004044045 scopus 로고
    • Applied Science Publishers: London
    • Bucknall, C. B. In Toughened Plastics; Applied Science Publishers: London, 1977.
    • (1977) Toughened Plastics
    • Bucknall, C.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.