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Volumn 92, Issue 10, 2007, Pages 1685-1694

Non-ideality and defectivity of the åkermanite-gehlenite solid solution: An X-ray diffraction and TEM study

Author keywords

Electron microscopy; Melilite; Solid solution; X ray diffraction

Indexed keywords

ALUMINUM METALLOGRAPHY; CRYSTAL ATOMIC STRUCTURE; DEFECTS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; SILICON WAFERS; SINGLE CRYSTALS; VOLUMETRIC ANALYSIS; X RAY DIFFRACTION;

EID: 35448974553     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2380     Document Type: Article
Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.