Infrared spectral emissivity characterization facility at NIST

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5405, Issue , 2004, Pages 1-12

  Hanssen, Leonard ^a   Mekhontsev, Sergey ^a   Khromchenko, Vladimir ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Blackbody; Infrared; Spectral emissivity; Spectral emittance; Sphere reflectometer

Indexed keywords

BLACKBODY; SPECTRAL EMISSIVITY; SPECTRAL EMITTANCE; SPHERE REFLECTOMETERS;

DATA REDUCTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED RADIATION; OXIDATION; RADIOMETERS; REFLECTION; REFLECTOMETERS; SPECTRUM ANALYSIS;

ELECTROMAGNETIC WAVE EMISSION;

EID: 3543120612     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.542224     Document Type: Conference Paper

References (12)

1. L.M. Hanssen, S.G. Kaplan, and S.N. Mekhontsev, "Fourier transform system for characterization of infrared spectral emittance of materials," Proceedings of the 8th International Symposium on Temperature and Thermal Measurements in Industry and Science (TEMPMEKO 2001), Berlin, June 19-21, 2001, pp 212-221.
2. S.G. Kaplan and L.M. Hanssen, "Infrared regular reflectance and transmittance instrumentation and standards at NIST," Analytica Chimica Acta 380, 303-310 (1998).
3. L.M. Hanssen and S.G. Kaplan, "Infrared diffuse reflectance instrumentation and standards at NIST," Analytica Chimica Acta 380, 289-302 (1998).
4. D.J. Dummer, S.G. Kaplan, L.M. Hanssen, A.S. Pine, and Y. Zong, "High-quality Brewster's angle polarizer for broadband infrared application," Applied Optics 37, no. 7, 1194-1204 (1998).
5. S.G. Kaplan and L.M. Hanssen, "FTIR-based ellipsometer using high-quality Brewster-angle polarizers," Proc. SPIE 3754, 285-293 (1999).
6. L.M. Hanssen, "Integrating sphere method for absolute transmittance, reflectance and absorptance of specular samples," Appl. Opt. 40, 3196-3204 (2001).
7. L.M Hanssen and K.A Snail, "Integrating spheres for mid- and near infrared reflection spectroscopy", in Handbook of Vibrational Spectroscopy, J.M. Chalmers and P.R. Griffiths (Eds), John Wiley & Sons, Ltd, Volume 2, pp. 1175-1192 (2002).
8. M. Battuelo and T. Ricolfi, "A technique for deriving emissivity data for infrared pyrometry," High Temp.-High Press. 21, 303-309 (1989).
9. th International Symposium on Temperature and Thermal Measurements in Industry and Science (TEMPMEKO 2001), Berlin, June 19-21, 2001, pp. 277-282.
10. Prokhorov, A., Mekhontsev S., and Hanssen L., "Monte Carlo modeling of an integrating sphere reflectometer," Appl. Opt. 42(19), 3832-3842 (2003).
11. Certain commercial equipment, instruments, or materials are identified in this paper to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.
12. S.N. Mekhontsev and L.M. Hanssen, "Low scatter optical system for emittance and temperature measurements," in Temperature: Its Measurement and Control in Science and Industry, Volume 7, ed. D.C. Ripple, AIP pp. 693-698 (2001).