Phase transition VO2 thin films for optical switches

International Journal of Infrared and Millimeter Waves

Volumn 25, Issue 1, 2004, Pages 157-163

  Chen, Sihai ^a   Yi, Xinjian ^a   Ma, Hong ^a   Xiong, Tao ^a   Wang, Hongcheng ^a   Ke, Caijun ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Optical switching; Reactive ion sputtering; Vanadium dioxide thin films

Indexed keywords

ARGON; CRYSTALLINE MATERIALS; INFRARED RADIATION; ION BEAMS; OPTICAL SWITCHES; PHASE TRANSITIONS; SEMICONDUCTOR MATERIALS; SILICON; SPUTTERING; SUBSTRATES; VANADIUM;

EXTINCTION RATIO; ION BEAM SPUTTERING; METAL-INSULATOR (MI); VANADIUM DIOXIDE;

THIN FILMS;

EID: 3543048963     PISSN: 01959271     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:IJIM.0000012771.09884.61     Document Type: Conference Paper

References (8)

1. F J Morin. Oxides which show a metal-to insulator transition at the neel temperature. Phys. Rev. Lett., vol. 3, pp. 34-36, 1959.
2. Luiz Alberto Luz de Almeida, Gurdip Singh Deep, Antonio Marcus Nogueira Lima, "A Hysteresis Model for a Vanadium DioxideTransition-Edge Microbolometer," IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, vol. 50, no. 4, pp.1020-1035, AUGUST 2001.
3. Xinjian Yi, Changhong Chen, and Luqin Liu, et.al. "A new fabrication method for vanadium dioxide thin films deposited by ion beam sputtering" Infrared Physics and Technology Vol. 44, No. 2, pp. 137-141, April, 2003.
4. 2-based uncooled microbolometer linear array" Sensors and Actuators A: Physical Volume: 90, Issue: 3, pp. 212-214, May 20, 2001.
5. 2 film near the metal-insulator transition," PHYSICAL REVIEW B, vol. 54, no. 7, pp. 4621-4628, AUGUST 1996.
6. 2 thin film and its direct optical bit recording characteristics", Applied Optics, vol. 22, no.2, pp.265-268, Jan. 1983
7. C. M. Lampert, "Electrochromic materials and devices for energy efficient windows", Solar Energy Mat. 11,1(1984).-18-
8. Yin Dachuan, "Vanadium dioxide films with good electrical switching property," Journal of Physics. D: Applied Physics, vol. 29, pp. 1051, Apr, 1996