Microstructure characterization of long W core SiC fiber

Journal of Materials Science and Technology

Volumn 23, Issue 5, 2007, Pages 677-684

  Guo, Changyou ^a,b   Zhang, Caibei ^a   He, Lianlong ^b   Jin, Baohong ^b   Shi, Nanlin ^b  

^a NORTHEASTERN UNIVERSITY   (China)

^b INSTITUTE OF METAL RESEARCH   (China)

Author keywords

Analytical electron microscopy (AEM); C rich zone; Chemical vapor deposition (CVD); Reaction products; SiC fiber

Indexed keywords

CHARACTERIZATION; CHEMICAL REACTIONS; CHEMICAL VAPOR DEPOSITION; FIBERS; MICROSTRUCTURE; SILICON CARBIDE; TUNGSTEN; TUNGSTEN CARBIDE;

CARBON COATING; CARBON RICH ZONE; REACTION PRODUCTS; SILICON CARBIDE FIBER; SILICON CARBIDE SHEATH; TUNGSTEN CORE;

INTERFACES (MATERIALS);

EID: 35349004754     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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