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Volumn 43, Issue 2, 2007, Pages 165-170
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Effects of free carbon on microstructure of CVD SiC fiber
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Author keywords
Analytical electron microscopy (AEM); Microstructure; SiC fiber; Strength
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
FIBERS;
MICROSTRUCTURE;
STRENGTH OF MATERIALS;
ANALYTICAL ELECTRON MICROSCOPY (AEM);
GRAIN SIZE;
SILICON CARBIDE FIBER;
SILICON CARBIDE;
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EID: 34147212168
PISSN: 04121961
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (15)
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