Optical characterization of a GaAs/In0.5(AlxGa 1-x)0.5P/GaAs heterostructure cavity by piezoreflectance spectroscopy

Optics Express

Volumn 15, Issue 21, 2007, Pages 13886-13893

  Ho, Ching Hwa ^a   Li, Ji Han ^a   Lin, Yu Shyan ^a  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; BAND STRUCTURE; GALLIUM COMPOUNDS; HETEROJUNCTIONS; OSCILLATORS (ELECTRONIC); REFRACTION; REFRACTIVE INDEX; THERMAL EFFECTS;

FABRY PEROT SYSTEM; INTERFERENCE FRINGES; OPTICAL PARAMETERS; PIEZOREFLECTANCE SPECTROSCOPY;

BINARY MIXTURES;

EID: 35348973572     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.013886     Document Type: Article

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