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Volumn 505-507, Issue PART 2, 2006, Pages 1225-1230
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Chemical-assisted mechanical polishing of diamond film on wafer
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Author keywords
Diamond film; Material removal rate; Polishing; Surface roughness
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
POLISHING;
POTASSIUM COMPOUNDS;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
MATERIAL REMOVAL RATE;
NON-UNIFORM THICKNESS;
POTASSIUM PERMANGANATE;
DIAMOND FILMS;
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EID: 35348847164
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.505-507.1225 Document Type: Conference Paper |
Times cited : (29)
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References (6)
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