Mechanical and electrical properties of ZnO-nanowire/Si-substrate junctions studied by scanning probe microscopy

Acta Physica Polonica A

Volumn 112, Issue 2, 2007, Pages 255-260

  Aleszkiewicz, M ^a   Fronc, K ^a   Wrobel J ^a   Klepka, M ^a   Wojtowicz, T ^a   Karczewski, G ^a  

^a INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRON TUNNELING; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; ZINC OXIDE;

DEPOSITION DENSITY; TUNNELING I-V CHARACTERISTICS;

NANOWIRES;

EID: 35248891463     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.112.255     Document Type: Article

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