Distance between attributed graphs and function-described graphs relaxing 2nd order restrictions

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 1876 LNCS, Issue , 2000, Pages 277-286

  Alquézar, René ^a   Serratosa, Francesc ^b   Sanfeliu, Alberto ^c  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^b UNIVERSITAT ROVIRA I VIRGILI   (Spain)

^c ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHIC METHODS;

ATTRIBUTED GRAPHS; BINARY CONSTRAINTS; DISTANCE MEASURE; EXTERNAL NOISE; FUNCTION-DESCRIBED GRAPHS; ORDER RESTRICTION; REAL APPLICATIONS; STRUCTURAL PATTERN RECOGNITION;

PATTERN RECOGNITION;

EID: 35248819311     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-44522-6_29     Document Type: Conference Paper

References (6)

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2. th Int. Conf. Image Analysis and Processing, Firenze, Italy, Vol. I, pp. 701-708, 1997.
3. F. Serratosa, R. Alquézar and A. Sanfeliu, "Function- Described Graphs for structural pattern recognition", Technical report DEIM-RR-99-006, Universitat Rovira i Virgili, Tarragona, Spain, 1999.
4. A. Sanfeliu and K. Fu, "A distance measure between attributed relational graphs for pattern recognition", IEEE Transactions on Systems, Man and Cybernetics, vol. 13, pp. 353-362, 1983.
5. A.K.C. Wong and M. You, "Entropy and distance of random graphs with application to structural pattern recognition", IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 7, pp. 599-609, 1985.
6. th Int. Conf. Pattern Recognition, Barcelona, Spain, 2000.