메뉴 건너뛰기




Volumn 1451, Issue , 1998, Pages 112-121

Synthesis of function-described graphs

Author keywords

Attributed relational graphs; Function described graphs; Graph synthesis; Random graphs; Structural pattern recognition

Indexed keywords

GRAPH THEORY; GRAPHIC METHODS;

EID: 84947789832     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/bfb0033229     Document Type: Conference Paper
Times cited : (10)

References (8)
  • 1
    • 84947767966 scopus 로고    scopus 로고
    • Function-described graphs. In Pattern Recognition and Image Analysis
    • Centre de Visió per Computador, Univ. Autònoma de Barcelona, Vol.I
    • F. Serratosa and A. Sanfefiu: Function-described graphs. In Pattern Recognition and Image Analysis, Preprints of the 7th National Symposium on Pattern Recognition and Image Analysis, Centre de Visió per Computador, Univ. Autònoma de Barcelona, Vol.I (1997) 37-42
    • (1997) Preprints of the 7Th National Symposium on Pattern Recognition and Image Analysis , pp. 37-42
    • Serratosa, F.1    Sanfefiu, A.2
  • 4
    • 84947720821 scopus 로고    scopus 로고
    • Tech. Rep. IRI-DT-9803, Inst. de Robòtica i Informàtica Industrial, Univ. Politècnica de Catalunya - CSIC, Barcelona, Spain
    • F. Serratosa, A. Sanfeliu and R. Alqurzar: Distance and matching between hmctiondescribed graphs. Tech. Rep. IRI-DT-9803, Inst. de Robòtica i Informàtica Industrial, Univ. Politècnica de Catalunya - CSIC, Barcelona, Spain (1998)
    • (1998) Distance and Matching between Hmctiondescribed Graphs
    • Serratosa, F.1    Sanfeliu, A.2    Alqurzar, R.3
  • 5
    • 0018732476 scopus 로고
    • Error-correcting isomorphism of attributed relational graphs for pattern analysis
    • W.H. Tsai and K.S. Fu: Error-correcting isomorphism of attributed relational graphs for pattern analysis. IEEE Trans. Systems, Man and Cybernetics 9 (1979) 757-768
    • (1979) IEEE Trans. Systems, Man and Cybernetics , vol.9 , pp. 757-768
    • Tsai, W.H.1    Fu, K.S.2
  • 6
    • 0020752197 scopus 로고
    • A distance measure between attributed relational graphs for pattern recognition
    • A. Sanfeliu and K.S. Fu: A distance measure between attributed relational graphs for pattern recognition. IEEE Trans. Systems, Man and Cybernetics 13 (1983) 353-362
    • (1983) IEEE Trans. Systems, Man and Cybernetics , vol.13 , pp. 353-362
    • Sanfeliu, A.1    Fu, K.S.2
  • 7
    • 0021491949 scopus 로고
    • Entropy and distance of random graphs with application to structural pattern recognition
    • A.K.C. Wong and M.L. You: Entropy and distance of random graphs with application to structural pattern recognition. IEEE Trans. Pattern Analysis and Machine Intelligence 7 (1985) 599-609
    • (1985) IEEE Trans. Pattern Analysis and Machine Intelligence , vol.7 , pp. 599-609
    • Wong, A.K.C.1    You, M.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.