Electron-impact excitation of argon: Optical emission cross sections in the range of 300-2500 nm

Atomic Data and Nuclear Data Tables

Volumn 93, Issue 6, 2007, Pages 831-863

  Boffard, John B ^a   Chiaro, B ^a   Weber, Tobin ^a   Lin, Chun C ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; EXCITED STATES; GROUND STATE; IMPACT IONIZATION; LIGHT EMISSION;

AR ATOM; ELECTRON-IMPACT EXCITATION; ELECTRONS ENERGY; EMISSION CROSS SECTION; GAS PRESSURES; MEASUREMENTS OF; OPTICAL EMISSIONS; PRESSURE DEPENDENCE; RADIATION TRAPPING; RESONANCE LEVELS;

ARGON;

EID: 35148871404     PISSN: 0092640X     EISSN: 10902090     Source Type: Journal    
DOI: 10.1016/j.adt.2007.06.004     Document Type: Article

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