Determination of transition probabilities for argon using thomson scattering on an inductively coupled plasma

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 56, Issue 1, 1996, Pages 67-72

  De Regt, J M ^a   Tas, R D ^a   Van Der Mullen, J A M ^a   Van Der Sijde, B ^a   Schram, D C ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CARRIER CONCENTRATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONIC DENSITY OF STATES; MEASUREMENT ERRORS; PLASMAS; PROBABILITY; TEMPERATURE;

ABSOLUTE LINE EMISSION INTENSITY MEASUREMENTS; ELECTRON TEMPERATURE; INDUCTIVELY COUPLED PLASMA; OPTICAL MULTICHANNEL ANALYSER; POPULATION DENSITY; THOMSON SCATTERING; TRANSITION PROBABILITY; TWO DIMENSIONAL;

ELECTRON TRANSITIONS;

EID: 0030193030     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-4073(96)00020-9     Document Type: Article

References (10)

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