Hydrogen-related surface modifications of 20 nm thin straight-sided niobium nano-wires and niobium meander-films

Journal of Alloys and Compounds

Volumn 446-447, Issue , 2007, Pages 549-554

  Pundt, Astrid ^a   Nörthemann, Kai ^a   Schmidt, Sönke ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Atomic force microscopy (AFM); Metal hydrides; Nanostructured materials; Phase transitions

Indexed keywords

ATOMIC FORCE MICROSCOPY; FINITE ELEMENT METHOD; NANOSTRUCTURED MATERIALS; NIOBIUM; PHASE TRANSITIONS; PLASTIC DEFORMATION; SAPPHIRE; SCANNING TUNNELING MICROSCOPY; SURFACE TREATMENT; THIN FILMS;

HYDROGEN GAS PRESSURE; HYDROGEN LOADING; MEANDER FILMS; METAL HYDRIDES;

NANOWIRES;

EID: 35148857285     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.01.137     Document Type: Article

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