Magnetic nanowires on faceted sapphire surfaces

Thin Solid Films

Volumn 449, Issue 1-2, 2004, Pages 207-214

  Westphalen, A ^a   Zabel, H ^a   Theis Brohl K ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Faceting; Magnetic properties and measurements; Magnetic structures; X Ray scattering

Indexed keywords

ANNEALING; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; ETCHING; FREE ENERGY; HIGH TEMPERATURE EFFECTS; KERR MAGNETOOPTICAL EFFECT; LATTICE CONSTANTS; LITHOGRAPHY; MAGNETIC ANISOTROPY; MAGNETIC MATERIALS; MULTILAYERS; OPTICAL KERR EFFECT; SAPPHIRE; SURFACE PHENOMENA; X RAY SCATTERING;

FACETING; MAGNETIC PROPERTIES AND MEASUREMENTS; MAGNETIC STRUCTURES;

NANOSTRUCTURED MATERIALS;

EID: 1042281118     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.019     Document Type: Article

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