Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Surface Science

Volumn 601, Issue 20 SPEC. ISS., 2007, Pages 4764-4767

  Kotsugi, Masato ^a   Wakita, Takanori ^b   Kawamura, Naomi ^b   Taniuchi, Toshiyuki ^c   Ono, Kanta ^d   Suzuki, Motohiro ^b   Oshima, Masaharu ^c   Ishimatsu, Naoki ^e   Taniguchi, Masaki ^e   Maruyama, Hiroshi ^e  

^a HIROSHIMA UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^e HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Chromite (Cr2FeO4); EXAFS; Iron meteorite; Photoelectron emission microscope (PEEM); XAFS

Indexed keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; INCLUSIONS; IRON COMPOUNDS; METEORITES; MICROSCOPES; PHOTONS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

CRACKED DOMAINS; EXTRATERRESTRIAL MATERIALS; PHOTOELECTRON EMISSION MICROSCOPY (PEEM); SYNTHETIC CHROMITES;

PHOTOELECTRONS;

EID: 35148847386     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.048     Document Type: Article

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