Waveplate analyzer using binary magneto-optic rotators

Optics Express

Volumn 15, Issue 20, 2007, Pages 12989-12994

  Chen, Xiaojun ^a   Yan, Liaashan ^a   Yao, X Steve ^a,b  

^a General Photonics Corporation   (United States)

^b TIANJIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; LINEAR SYSTEMS; MAGNETOOPTICAL DEVICES; SOLID STATE DEVICES;

LINEAR RETARDERS; OPTICAL AXES; WAVE PLATE; WAVEPLATE ANALYZERS;

OPTICAL ROTATION;

EID: 35148816895     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.012989     Document Type: Article

References (16)

1. D. Goldstein, "Polarized light," (Second Edition, Marcel. Dekker, Inc., NY, 2003).
2. E. Collett, Polarized light: Fundamentals and Applications, (Marcel Dekker, New York, 1993) pp. 100-103.
3. H. G. Jerrard, "Optical compensators for measurement of elliptical polarization," J. Opt. Soc. Am. 38, 35-59 (1948).
4. D. H. Goldstein, "Mueller matrix dual-rotating retarder Polarimeter," Appl. Opt, 31, 6676-6683 (1992).
5. E. Dijkstra, H. Meekes, and M. Kremers, "The high-accuracy universal. Polarimeter," J. Phys. D 24, 18611868 (1991).
6. P. A. Williams, A. H. Rose, and C. M. Wang, "Rotating-polarizer Polarimeter for accurate retardance measurement," Appl. Opt. 36, 6466-6472 (1997).
7. D. B. Chenault and R. A. Chipman, "Measurements of linear diattenuation and linear retardance spectra with a rotating sample spectropolarimeter," Appl, Opt. 32, 3513-3519 (1993).
8. L. Shyu, C. Chen, and D. Su, "Method for measuring the retardation of a wave plate," Appl. Opt. 32, 42 4228-4230 (1993).
9. J. E. Hayden and S. D. Jacobs, "Automated spatially scanning ellipsometer for retardation measurements of transparent materials," Appl. Opt. 32, 6256-6263 (1993).
10. H. Takasaki, M. Isobe, T. Masaki, A. Konda, I. Agatsuma, and Y. Watanabe, Appl. Opt. 3, 343-350 (1964).
11. H. F. Hazebroek and A. A. Holscher, J Phys. E 6, 822-826 (1973).
12. T. Oakberg, "Measurement of waveplate retardation using a photoelastic modulator," Proc. SPIE 3121, 19-22, (1997).
13. K. B. Rochford and C. M. Wang, "Accurate interferometric retardance measurements," Appl. Opt. 36, 6473-6479 (1997).
14. X. S. Yao, L. S. Yan, and Y. Shi, "Highly repeatable all-solid-state polarization-state generator," Opt. Lett. 30, 1324-1327 (2005)
15. X. S. Yao, X. Chen, and L.S. Yan, "Self-calibrating binary polarization analyzer" Opt. Lett. 31, 1948-1950 (2006)
16. M. Born and E. Wolf, Principle of optics: Electromagnetic theory of propagation, interference and diffraction of light, (7th Edition, University Press, Cambridge, UK, 1999).