Accurate interferometric retardance measurements

Applied Optics

Volumn 36, Issue 25, 1997, Pages 6473-6479

  Rochford, Kent B ^a,b   Wang, C M ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Statistical Engineering Division   (United States)

Author keywords

Fresnel rhomb; Interferometry; Polarization; Retardance measurement

Indexed keywords

EID: 0009721107     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.006473     Document Type: Article

References (14)

1. K. B. Rochford, P. A. Williams, A. H. Rose, I. G. Clarke, P. D. Hale, and G. W. Day, “Standard polarization components: progress toward an optical retardance standard, ” in Polarization Analysis and Measurement II, D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE2265, 2-8 (1994).
2. K. B. Rochford, A. H. Rose, P. A. Williams, C. M. Wang, I. G. Clarke, P. D. Hale, and G. W. Day, “Design and performance of a stable linear retarder, ” Appl. Opt. 36, 6458-6465 (1997).
3. H. F. Hazebroek and A. A. Holscher, “Interferometric ellipsom-etry, ” J. Phys. E 6, 822-826 (1973).
4. H. F. Hazebroek and W. M. Visser, “Automated laser interferometric ellipsometry and precision reflectometry, ” J. Phys. E 16, 654-661 (1983).
5. D. Gabor, “Theory of communication. Part I. The analysis of information, ” J. Inst. Elec. Eng. 93, 429-441 (1946).
6. R. N. Bracewell, The Fourier Transform and Its Applications (McGraw-Hill, New York, 1986), pp. 267-271.
7. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1980), Vol. 6, pp. 619.
8. R. A. Paquin, “Properties of metals, ” in Handbook of Optics, M. Bass, E. W. Van Stryland, D. R. Williams, and W. L. Wolfe, eds. (McGraw-Hill, New York, 1995), Vol. 2 p. 35-22.
9. A. L. Fymat, “Jones’ matrix representation of optical instruments. I: Beam splitters, ” Appl. Opt. 10, 2499-2505 (1971).
10. F. J. Harris, “On the use of windows for harmonic analysis with discrete Fourier transform, ” Proc. IEEE 6, 51-83 (1978).
11. B. N. Taylor and C. E. Kuyatt, Guidelines for evaluating and expressing the uncertainty of NIST measurements National Institute of Standards Technology Technical Note 1297, 1993 (U.S. Government Printing Office, Washington, D.C.), pp. 2-5.
12. P. A. Williams, A. H. Rose, and C. M. Wang, “Rotating-polarizer polarimeter for accurate retardance measurement, ” Appl. Opt. 36, 6466-6472 (1997).
13. K. B. Rochford and C. M. Wang, “Uncertainty in null polarimeter measurements, ” IR. 5055, 1996 (National Institute of Standards and Technology, Gaithersburg, Md.).
14. E. Hecht and A. Zajak, Optics (Addison-Wesley, Reading, Mass, 1974), pp. 301-305.