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Volumn 601, Issue 20 SPEC. ISS., 2007, Pages 4706-4713

Coexisting electron emission mechanisms in small metal particles observed in fs-laser excited PEEM

Author keywords

Electron microscopy; Photoemission

Indexed keywords

ATOMIC FORCE MICROSCOPY; LASER APPLICATIONS; PHOTOEMISSION; SCANNING ELECTRON MICROSCOPY;

EID: 35148816092     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.046     Document Type: Article
Times cited : (24)

References (31)
  • 3
    • 35148899549 scopus 로고    scopus 로고
    • N. Georgiev, D. Martinotti, H.-J. Ernst, in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.