Exploiting symbolic model checking for sensing stuck-at faults in digital circuits

Informacije MIDEM

Volumn 32, Issue 3, 2002, Pages 171-180

  Časar, Aleš ^a   Brezočnik, Zmago ^a   Kapus, Tatjana ^a  

^a UNIVERSITY OF MARIBOR   (Slovenia)

Author keywords

Automatic test pattern generation; Binary decision diagrams; CTL formulas; Finite state machine; Stuck at faults; Symbolic model checking; Testing

Indexed keywords

EID: 35048817755     PISSN: 03529045     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (10)

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2. Randal E. Bryant. Graph-Based Algorithms for Boolean Function Manipulation. IEEE Transactions on Computers, C-35(8):677-691, August 1986.
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8. E. Clarke, O. Grumberg, K. McMillan, and X. Zhao. Efficient generation of counterexamples and witnesses in symbolic model checking. Technical report, School of Computer Science, Carnegie Mellon University, Pittsburgh, USA, October 1994.
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