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Volumn 40, Issue 19, 2007, Pages 3861-3875
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Spectra of W39+-W47+ in the 12-20 nm region observed with an EBIT light source
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE TRAPPING;
ELECTRON BEAMS;
IONIZATION;
SPECTRUM ANALYSIS;
UNCERTAINTY ANALYSIS;
EBIT PLASMA;
ELECTRON BEAM ION TRAP (EBIT);
REFERENCE LINES;
LIGHT SOURCES;
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EID: 34948892609
PISSN: 09534075
EISSN: 13616455
Source Type: Journal
DOI: 10.1088/0953-4075/40/19/007 Document Type: Article |
Times cited : (97)
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References (27)
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