Experimental characterization of the frequency modulation behavior of vertical cavity surface emitting lasers

Applied Physics Letters

Volumn 91, Issue 14, 2007, Pages

  Chen, Jia ^a,b   Hangauer, Andreas ^a,b   Strzoda, Rainer ^a,b   Amann, Markus Christian ^b  

^a SIEMENS AG   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT-TO-WAVELENGTH; FM RESPONSE BEHAVIOR; SQUARE ROOT LAW; WAVELENGTH TUNING RATE;

FREQUENCY MODULATION; LASER SPECTROSCOPY; LASER TUNING; SEMICONDUCTING INDIUM PHOSPHIDE; WAVELENGTH;

SURFACE EMITTING LASERS;

EID: 34948884721     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794406     Document Type: Article

References (13)

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