Electric-field-induced low temperature oxidation of tungsten nanowires

Applied Physics Letters

Volumn 89, Issue 14, 2006, Pages

  Nowak, C ^a   Kirchheim, R ^a   Schmitz, G ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STABILITY; CRITICAL FIELD STRENGTHS; NANOSCALED SYSTEMS; NANOWIRES;

ELECTRIC FIELD EFFECTS; LOW TEMPERATURE EFFECTS; OXIDATION; REACTION KINETICS; THICKNESS MEASUREMENT; TUNGSTEN;

NANOSTRUCTURED MATERIALS;

EID: 33749489360     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2358203     Document Type: Article

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