The structural characterization and dielectric properties of the La1-x Kx Co1-x Nbx O3 (x=0-1) System

Journal of the Electrochemical Society

Volumn 154, Issue 11, 2007, Pages

  Huang, Tzu Wei ^a   Chang, Yee Shin ^b   Chen, Guo Ju ^c   Chung, Ching Chang ^a   Chang, Yen Hwei ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^c I SHOU UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CHARACTERIZATION; CRYSTAL STRUCTURE; DIELECTRIC RELAXATION; ENERGY DISSIPATION; PERMITTIVITY; PHONONS;

DIELECTRIC MEASUREMENTS; DISSIPATION FACTORS; PHONON FREQUENCY; ROOM TEMPERATURE;

LANTHANUM;

EID: 34848819176     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2775168     Document Type: Article

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