Time-domain pulsed large-signal non-linear characterization of microwave transistors

Conference Proceedings - 33rd European Microwave Conference, EuMC 2003

Volumn 1, Issue , 2003, Pages 241-244

  Charbonniaud, C ^a   Teyssier, J P ^a   Quere R ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE DEVICES;

ACTIVE DEVICES; LARGE-SIGNALS; MICROWAVE TRANSISTORS; MODE-BASED; NONLINEAR MEASUREMENT; SAMPLING TECHNIQUE; TIME DOMAIN; TIME DOMAIN CHARACTERIZATIONS;

TIME DOMAIN ANALYSIS;

EID: 34748923984     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2003.1262264     Document Type: Conference Paper

References (4)

1. C. Amaud, et al., "Nouvelle caractérisation dans le domaine temparelle de dispositifs R.F. et microondes à l'aide d'un analyseur de réseau vectoriel. Application a 1'optimisation d'amplificateurs de puissance à haut rendement et de multiplieurs de frequences", 1lième JNM, Arcachon, Mai 1999.
2. J. Verspecht, K. Rush, "Braodband sampling Oscilloscope Characterization with the Nose to Nose Calibration Procedure ", IEEE inst. and Measurement Technology Conference, Hammamatsu, Japan, pp 526-529, May 1994.
3. J.P. Teyssier, et al., "40-GHz/150-ns Versatile Pulsed Measurement System for Microwave Isothermal Characterization ", IEEE Trans on MTT, vol 46, pp2043-2052, December 1998.
4. J.P. Teyssier, et al. " Large-Signal Time Domain Characterization of Microwave Transistors under Pulsed Conditions", 57th ARFTG, Phoenix, Arizona, May 2001