Complete pure-mode balanced measurement system

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2007, Pages 1485-1488

  Dunsmore, Joel ^a   Anderson, Keith ^a   Blackham, David ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Differential amplifiers; Differential analyzers; Microwave measurements; Nonlinear circuits; Scattering parameters measurement

Indexed keywords

DIFFERENTIAL AMPLIFIERS; ERROR CORRECTION; NONLINEAR ANALYSIS; SCATTERING PARAMETERS; SIGNAL ANALYSIS;

DIFFERENTIAL ANALYZERS; NONLINEAR CIRCUITS; SCATTERING PARAMETERS MEASUREMENT; SIGNAL ERRORS;

POWER AMPLIFIERS;

EID: 34748836995     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2007.380534     Document Type: Conference Paper

References (6)

1. D. E. Bockelman, W. R. Eisenstadt, "Combined Differential and Common-Mode Scattering Parameters: Theory and Simulation", IEEE Trans. on MTT, Vol. 43, No. 7, July 1995, pp. 1530-1539
2. D. E. Bockelman and W. R. Eisenstadt, "Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits," IEEE Trans. MTT., vol. 45, no. 7, pp. 1071-1077, Jul. 1997.
3. D. E. Bockelman, W. R. Eisenstadt, "Calibration and Verification of a Pure-Mode Network Analyzer", IEEE Transactions on MTT, Vol. 46, No. 7, July 1998, pp. 1009-1012.
4. J.Dunsmore, "New Methods & Non-Linear Measurements for Active Differential Devices", Microwave Sym. Digest, 2003 IEEE MTT-S, Volume: 3, 8-13 June 2003, pages: 1655-1658.
5. J.Dunsmore, "New Measurement Results and Models for Nonlinear Differential Amplifier Characterization", Conference Proc. 34th European Microwave Conference, 2004, pt. 2, p 689-92 vol.2
6. Zwick, T.; Pfeiffer, U.R., "Pure-mode network analyzer concept for on-wafer measurements of differential circuits at millimeter-wave frequencies", IEEE Trans on MTT, Volume: 53, Issue: 3, March 2005,pp. 934-937