Measuring Volterra kernels of analog to digital converters using a stepped three-tone scan

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2006, Pages 1047-1050

  Björsell, Niclas ^a   Rönnow, Daniel ^a   Händel, Peter ^b  

^a UNIVERSITY OF GÄVLE   (Sweden)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

ADC; Analog to digital converters; Measurements; Test; Volterra kernels

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; MATHEMATICAL MODELS; NATURAL FREQUENCIES; SAMPLING; SIGNAL PROCESSING;

NONLINEAR DYNAMIC COMPONENTS; VOLTERRA KERNELS;

ANALOG TO DIGITAL CONVERSION;

EID: 34648858872     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.234872     Document Type: Conference Paper

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