Allan variance analysis of measurement data series for instrument verification

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2007, Pages

  Bertocco, M ^a   Monetti, A ^b   Mottin, E ^a   Narduzzi, C ^a   Sieni, E ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b Infineon Technologies Italia Srl   (Italy)

Author keywords

Allan variance; Calibration laboratory; Measurement noise

Indexed keywords

CALIBRATION; CONVERGENCE OF NUMERICAL METHODS; SPURIOUS SIGNAL NOISE; VERIFICATION;

ALLAN VARIANCE ANALYSIS; CALIBRATION LABORATORY; MEASUREMENT NOISE;

DATA REDUCTION;

EID: 34648828075     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/imtc.2007.379059     Document Type: Conference Paper

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