Allan variances and spectral densities for DC voltage measurements with polarity reversals

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 550-553

  Witt, Thomas J ^a  

^a PAVILLON DE BRETEUIL   (France)

Author keywords

1 f noise; Noise measurement; Spectral analysis; White noise

Indexed keywords

DIGITAL VOLTMETERS; FOURIER TRANSFORMS; PERTURBATION TECHNIQUES; SPECTRUM ANALYSIS; THERMAL NOISE; WHITE NOISE; ZENER DIODES;

ALLAN VARIANCES; DC VOLTAGE MESUREMENTS; NOISE MEASUREMENT; POLARITY REVERSAL; SPECTRAL DENSITIES;

VOLTAGE MEASUREMENT;

EID: 17444420046     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843054     Document Type: Article

References (5)

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2. T. J. Witt, "Using the Allan variance and power spectral density to characterize DC nanovoltmeters," IEEE Trans. Instrum. Meas., vol. 50, no. 2, pp. 445-448, Apr. 2001.
3. J. E. Barnes et al., "Characterization of frequency stability," IEEE Trans. Instrum. Meas., vol. IM-20, no. 2, pp. 105-120, May 1971.
4. C. Audoin, "Frequency metrology," in Proc. Int. School Physics "Enrico Fermi" Metrology Fundamental Constants, 1980, pp. 169-222.
5. D. B. Percival and A. T. Walden, Wavelet Methods for Time Series Analysis. Cambridge, U.K.: Cambridge Univ. Press, 2000.