Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 684-685

  Ang, Kah Wee ^a,b   Wan, Chunlei ^a   Chui, King Jien ^a   Tung, Chih Hang ^b   Balasubramanian, N ^b   Li, Ming Fu ^a   Samudra, Ganesh ^a   Yeo, Yee Chia ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; HOT CARRIERS; LATTICE MISMATCH; SILICON;

DRIVE CURRENT; HOT CARRIER RELIABILITY; OPERATING VOLTAGES;

MOSFET DEVICES;

EID: 34548800786     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369569     Document Type: Conference Paper

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