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Volumn 47, Issue 9-11 SPEC. ISS., 2007, Pages 1663-1667

Torsion test applied for reballing and solder paste volume evaluation

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; RELIABILITY ANALYSIS; SOLDERING ALLOYS; THERMAL CYCLING; TORSION TESTING;

EID: 34548697735     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.07.028     Document Type: Article
Times cited : (6)

References (5)
  • 1
    • 34548673389 scopus 로고    scopus 로고
    • Maia Filho WC, Brizoux M, Frémont H, Danto Y. Solder joint loading conditions under torsion test IEEE, CPMT, Eurosime 2006, Italy; 2006.
  • 2
    • 33747774137 scopus 로고    scopus 로고
    • Improved physical understanding of intermittent failure in continuous monitoring method
    • Maia Filho W.C., Brizoux M., Frémont H., and Danto Y. Improved physical understanding of intermittent failure in continuous monitoring method. Microelectron Reliab 46 (2006) 1886-1891
    • (2006) Microelectron Reliab , vol.46 , pp. 1886-1891
    • Maia Filho, W.C.1    Brizoux, M.2    Frémont, H.3    Danto, Y.4
  • 3
    • 34548699431 scopus 로고    scopus 로고
    • Wilcox JR, Godown TC, Adams JA. A Pb-free transition strategy for servers. In: IPC soldertec global conference on lead free electronics 2005, Barcelona, Spain; 2005.
  • 4
    • 34548702732 scopus 로고    scopus 로고
    • Maia Filho WC, Grivon A, Brizoux M. Evaluation of BGA reballing process as a solution for backward issue. In: IPC/JEDEC international conference on lead free electronic components and assemblies, Frankfurt, Germany; 2006.
  • 5
    • 34548664684 scopus 로고    scopus 로고
    • CBGA Surface Mount Assembly and Rework, User's Guide. IBM. http://www.ibm.com May 23; 2002.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.