Characterization of SWCNT and PAN/SWCNT films

Carbon

Volumn 45, Issue 12, 2007, Pages 2417-2423

  Bellayer, S ^a   Gilman, J W ^b   Rahatekar, S S ^b   Bourbigot, S ^a   Flambard, X ^c   Hanssen, L M ^b   Guo, H ^d   Kumar, S ^d  

^a Ecole Nationale Superieure de Chimie de Lille   (France)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c GEMTEX   (France)

^d GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CONFOCAL MICROSCOPY; HEAT FLUX; POLYACRYLONITRILES; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECTROPHOTOMETERS;

FOURIER TRANSFORM SPECTROPHOTOMETERS; POLISHED SURFACES; TRANSMITTANCE;

POLYMER FILMS;

EID: 34548693678     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2007.06.057     Document Type: Article

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