Density and structure of undercooled molten silicon using synchrotron radiation combined with an electromagnetic levitation technique

Journal of Non-Crystalline Solids

Volumn 353, Issue 32-40, 2007, Pages 2997-2999

  Higuchi, K ^a   Kimura, K ^a   Mizuno, A ^a   Watanabe, M ^a   Katayama, Y ^b   Kuribayashi, K ^c  

^a GAKUSHUIN UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

Short range order; Structure; X ray diffraction

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; MOLECULAR STRUCTURE; SYNCHROTRON RADIATION; UNDERCOOLING; X RAY DIFFRACTION;

ELECTROMAGNETIC LEVITATION; MOLTEN SILICON; SHORT-RANGE ORDER; TEMPERATURE REGIONS;

SILICON;

EID: 34548580592     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.05.029     Document Type: Article

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