Precise measurement of density and structure of undercooled molten silicon by using synchrotron radiation combined with electromagnetic levitation technique

Measurement Science and Technology

Volumn 16, Issue 2, 2005, Pages 381-385

  Higuchi, K ^a   Kimura, K ^a   Mizuno, A ^a   Watanabe, M ^a   Katayama, Y ^b   Kuribayashi, K ^c  

^a GAKUSHUIN UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

Density; Electromagnetic levitation; Structure; Synchrotron radiation; Undercooled molten silicon

Indexed keywords

CHEMICAL BONDS; COOLING; CRYSTAL ATOMIC STRUCTURE; ELECTROMAGNETISM; IMAGE ANALYSIS; MOLTEN MATERIALS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

COORDINATION NUMBER; ELECTROMAGNETIC LEVITATION; MOLTEN SILICON; TETRAHEDRAL BONDS;

SILICON;

MEASUREMENT METHOD; PRECISION; SILICON;

EID: 13944275227     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/16/2/008     Document Type: Article

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