An NP control chart using double inspections

Journal of Applied Statistics

Volumn 34, Issue 7, 2007, Pages 843-855

  Wu, Zhang ^a   Wang, Qinan ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Average run length; Control chart; Double inspection; Quality control; Statistical process control

Indexed keywords

EID: 34548573095     PISSN: 02664763     EISSN: 13600532     Source Type: Journal    
DOI: 10.1080/02664760701523492     Document Type: Article

References (8)

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