Optimal np control chart with curtailment

European Journal of Operational Research

Volumn 174, Issue 3, 2006, Pages 1723-1741

  Wu, Zhang ^a   Luo, Hua ^a   Zhang, Xiaolan ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Average time to signal; Curtailment; Quality control; Sample size; Steady state mode

Indexed keywords

ALGORITHMS; MEASUREMENT THEORY; OPTIMIZATION; PRODUCT DESIGN; QUALITY CONTROL; RANDOM PROCESSES; SAMPLING;

AVERAGE TIME TO SIGNALS; CURTAILMENT; SAMPLE SIZE; STEADY-STATE MODE;

OPTIMAL CONTROL SYSTEMS;

EID: 33746859829     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ejor.2005.03.038     Document Type: Article

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