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Volumn 194, Issue 1-3, 2007, Pages 151-158
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Control of micro-spark and stray-current effect during EMM process
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Author keywords
EMM; Micro spark and stray current affected zone (MSAZ); RSM
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Indexed keywords
ELECTROCHEMISTRY;
ELECTROLYTES;
MATERIALS SCIENCE;
MATHEMATICAL MODELS;
MICROMACHINING;
PARAMETER ESTIMATION;
ELECTRIC CURRENTS;
ELECTRIC SPARKS;
SCANNING ELECTRON MICROSCOPY;
MICRO-SPARK AND STRAY-CURRENT AFFECTED ZONE (MSAZ);
SEM MICROGRAPHS;
ELECTRIC FIELD EFFECTS;
MICROMACHINING;
ELECTROCHEMICAL MICROMACHINING (EMM);
MACHINE MATERIALS;
MICRO-SPARKING;
STRAY-CURRENT EFFECT;
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EID: 34548558694
PISSN: 09240136
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmatprotec.2007.04.112 Document Type: Article |
Times cited : (45)
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References (10)
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