Elemental mapping by means of an ultra-fast XRF spectrometer based on a novel high-performance monolithic array of Silicon Drift Detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 580, Issue 2, 2007, Pages 1004-1007

  Alberti, R ^a,b   Fiorini, C ^a,b   Guazzoni, C ^a,b   Klatka, T ^a,b   Longoni, A ^a,b  

^a POLITECNICO DI MILANO   (Italy)

^b INFN SEZIONE DI MILANO   (Italy)

Author keywords

Elemental mapping; Silicon Drift Detectors; X ray spectroscopy

Indexed keywords

DATA ACQUISITION; FLUORESCENCE; GEOMETRY; IMAGE ANALYSIS; SILICON DETECTORS; X RAYS;

DETECTION RATES; ELEMENTAL MAPPING; HIGH PERFORMANCE MONOLITHIC ARRAYS; SILICON DRIFT DETECTORS;

SPECTROMETERS;

EID: 34548507033     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.06.056     Document Type: Article

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