The effect of gauge volume on the tensile properties of nanocrystalline electrodeposits

Scripta Materialia

Volumn 57, Issue 11, 2007, Pages 996-999

  Wei, H ^a   Hibbard, G D ^a   Palumbo, G ^b   Erb, U ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b Integran Technologies Inc   (Canada)

Author keywords

Electroplating; Nanocrystalline materials; Plastic deformation; Tension test

Indexed keywords

CRYSTAL DEFECTS; ELECTRODEPOSITION; GRAIN SIZE AND SHAPE; NANOCRYSTALLINE MATERIALS; SYNTHESIS (CHEMICAL); TENSILE STRENGTH;

DISCONCERTING EFFECT; GAUGE VOLUME; INTERNAL FLAWS; NANOCRYSTALLINE ELECTRODEPOSITS; TENSION TEST;

STRAIN GAGES;

EID: 34548500131     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.08.008     Document Type: Article

References (13)

1. Palumbo G., Gonzalez F., Tomantschger K., Erb U., and Aust K.T. Plat. Surf. Finish. 90 (2003) 36
2. McCrea J.L., Palumbo G., Hibbard G.D., and Erb U. Rev. Adv. Mater. Sci. 5 (2003) 252
3. Wang N., Wang Z., Aust K.T., and Erb U. Mater. Sci. Eng. A 237 (1997) 150
4. Dalla Torre F., Van Swygenhoven H., and Victoria M. Acta Mater. 50 (2002) 3957
5. Zimmerman A.F., Palumbo G., Aust K.T., and Erb U. Mater. Sci. Eng. A 328 (2002) 137
6. Fan G.J., Fu L.F., Qiao D.C., Choo H., Liaw P.K., and Browning N.D. Scripta Mater. 54 (2006) 2137
7. Li H., and Ebrahimi F. Acta Mater. 54 (2006) 2877
8. Dieter G.E. Mechanical Metallurgy. 3rd ed. (1986), McGraw-Hill, Toronto
9. ASTM Standard E8-04, ASTM International, West Conshohocken, PA, 2004.
10. Cheung C., Djuanda F., Erb U., and Palumbo G. Nanostruct. Mater. 5 (1995) 513
11. H.S. Wei, G.D. Hibbard, G. Palumbo, U. Erb, in press.
12. Turner D.R. In: Schlesinger M., and Paunovic M. (Eds). Modern Electroplating. 4th ed. (2000), John Wiley, Toronto 769-790
13. Karimpoor A.A., Erb U., Aust K.T., and Palumbo G. Scripta Mater. 49 (2003) 651