Deposition process, microstructure and properties of YBCO film fabricated by advanced TFA-MOD method

Physica C: Superconductivity and its Applications

Volumn 463-465, Issue SUPPL., 2007, Pages 527-531

  Tanaka, T ^a   Tada, K ^a   Mori, N ^a   Yamada, K ^a   Teranishi, R ^a   Mukaida, M ^a   Shiohara, Y ^b   Izumi, T ^b   Matsuda, J ^b  

^a KYUSHU UNIVERSITY   (Japan)

^b SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

Advanced TFA MOD; In situ observation; JC; TEM; XRD; YBa2Cu3O7

Indexed keywords

COATED MATERIALS; FABRICATION; GRAIN BOUNDARIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; SUPERCONDUCTING FILMS;

COATED CONDUCTORS; CRYSTAL GRAIN ALIGNMENT; FILMS QUENCHING; VACUUM PROCESSES;

YTTRIUM BARIUM COPPER OXIDES;

EID: 34548479746     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2007.01.041     Document Type: Article

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