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Volumn 445-448, Issue 1-2, 2006, Pages 570-573

Growth process and microstructure of Y123 film fabricated by advanced TFA-MOD process

Author keywords

Advanced TFA MOD; In situ observation; JC; TEM; XRD; YBa2Cu3O7

Indexed keywords

CRYSTAL GROWTH; LANTHANUM COMPOUNDS; PROCESS CONTROL; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 33748625441     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2006.04.050     Document Type: Article
Times cited : (12)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.