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Volumn 445-448, Issue 1-2, 2006, Pages 570-573
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Growth process and microstructure of Y123 film fabricated by advanced TFA-MOD process
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Author keywords
Advanced TFA MOD; In situ observation; JC; TEM; XRD; YBa2Cu3O7
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Indexed keywords
CRYSTAL GROWTH;
LANTHANUM COMPOUNDS;
PROCESS CONTROL;
SURFACE PROPERTIES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ADVANCED TFA-MOD;
IN-SITU OBSERVATION;
JC;
YBA2CU3O7-Δ;
THIN FILMS;
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EID: 33748625441
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physc.2006.04.050 Document Type: Article |
Times cited : (12)
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References (9)
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