Chemical and structural characterization of barium hexaferrite films deposited on 6H-SiC with and without MgO/BaM interwoven layers

Journal of Crystal Growth

Volumn 307, Issue 2, 2007, Pages 321-327

  Cai, Zhuhua ^a   Chen, Zhaohui ^b   Goodrich, Trevor L ^a   Harris, V G ^b   Ziemer, Katherine S ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

^b Northeastern University   (United States)

Author keywords

A1. Si diffusion; A1. XPS depth profile; A3. PLD; B1. Barium ferrite; B1. Magnesium oxide; B2. Silicon carbide

Indexed keywords

BARIUM COMPOUNDS; COERCIVE FORCE; DEPTH PROFILING; FILM GROWTH; LINEWIDTH; MAGNESIA; PULSED LASER DEPOSITION; SATURATION MAGNETIZATION; SILICON CARBIDE; SINGLE CRYSTALS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERMEDIATE STAGES; INTERWOVEN LAYERS; STRUCTURAL CHARACTERIZATION;

EPITAXIAL FILMS;

EID: 34548442926     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.06.031     Document Type: Article

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