Role of defect states on Auger processes in resonantly pumped CdSe nanorods

Applied Physics Letters

Volumn 91, Issue 9, 2007, Pages

  Cretí, Arianna ^a,b   Anni, Marco ^c   Zavelani Rossi, Margherita ^b   Lanzani, Guglielmo ^b   Manna, Liberato ^d   Lomascolo, Mauro ^a  

^a CNR   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c UNIVERSITY OF SALENTO   (Italy)

^d NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CADMIUM COMPOUNDS; DEFECTS; LIGHT ABSORPTION; LIGHT SCATTERING; RELAXATION PROCESSES;

AUGER PROCESSES; AUGER SCATTERING; DEFECT STATES;

NANORODS;

EID: 34548437616     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2776847     Document Type: Article

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22. The average number 〈 N0 〉 of electron-hole pair is estimated by 〈 N0 〉 =jp ρ0, where jp is the excitation fluence and ρ0 is the absorption cross section of the rod at a pump spectral energy. At NR pump energy (3.18 eV), ρ0 can be evaluated by means of the rule suggested by V. I. Klimov, J. Phys. Chem. B 1089-5647 10.1021/jp9944132 104, 6112 (2000) and Htoon et al. (Ref.). At R pumping energy, ρ0 can be estimated by means the comparison of the oscillator strength f0
23. [see Klimov, J. Phys. Chem. B 104, 6112 (2000)] at 3.18 eV and at 1S state. In this work at high pump fluence, 〈 N0 〉 results to about 1.0-1.5 pairs for R pumping and to about 2.5-4 pairs for NR pumping.