Current-carrying property and microstructure of multilayered Sm1+xBa2-xCu3Oy thick films

Physica C: Superconductivity and its Applications

Volumn 463-465, Issue SUPPL., 2007, Pages 649-652

  Ozaki, T ^a,f   Yoshida, Y ^a,f   Miura, M ^a,f   Ichino, Y ^a,f   Takai, Y ^a   Matsumoto, K ^b,f   Ichinose, A ^c,f   Horii, S ^d,f   Mukaida, M ^e,f  

^a NAGOYA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e KYUSHU UNIVERSITY   (Japan)

^f JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Critical current; Multilayer; Sm1+xBa2 xCu3Oy; Thick film

Indexed keywords

FILM THICKNESS; MAGNETIC FIELD EFFECTS; MICROSTRUCTURE; MULTILAYERS;

CRITICAL CURRENT; CURRENT-CARRYING PROPERTY;

THICK FILMS;

EID: 34548400850     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2007.03.463     Document Type: Article

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