Influence of surface morphology on the thickness dependence of high-J c Sm1+xBa2-xCu3O 6+δ films

Physica C: Superconductivity and its Applications

Volumn 392-396, Issue PART 2, 2003, Pages 1265-1269

  Itoh, Masakazu ^a   Sudoh, Kimihiko ^a   Ichino, Yusuke ^a   Yoshida, Yutaka ^a   Takai, Yoshiaki ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Critical current density; Film thickness; Precipitate; Pulsed laser deposition; Sm1+xBa2 xCu3O6+ film

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTALLIZATION; FILM GROWTH; MORPHOLOGY; PULSED LASER DEPOSITION; SAMARIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

FILM THICKNESS;

THIN FILMS;

EID: 0042691657     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(03)00781-0     Document Type: Conference Paper

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