메뉴 건너뛰기




Volumn 12, Issue SUPPL. 1, 2007, Pages 26-31

Soft Fault Diagnosis for Analog Circuits Based on Slope Fault Feature and BP Neural Networks

Author keywords

analog circuit; back propagation neural network (BPNN); slope; soft fault diagnosis; voltage relation function

Indexed keywords

BACKPROPAGATION; CIRCUIT SIMULATION; ELECTRIC POTENTIAL; FAILURE ANALYSIS; FREQUENCY RESPONSE; NEURAL NETWORKS;

EID: 34548290950     PISSN: 10070214     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1007-0214(07)70079-2     Document Type: Article
Times cited : (35)

References (12)
  • 3
    • 0033204734 scopus 로고    scopus 로고
    • The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method
    • Li F., and Woo P.-Y. The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method. IEEE Trans. on Circuits and Systems-I: Fundamental Theory and Applications 46 10 (1999) 1222-1227
    • (1999) IEEE Trans. on Circuits and Systems-I: Fundamental Theory and Applications , vol.46 , Issue.10 , pp. 1222-1227
    • Li, F.1    Woo, P.-Y.2
  • 4
    • 0012226433 scopus 로고    scopus 로고
    • A new fault dictionary method for fault diagnosis of analog circuits
    • (in Chinese).
    • Tan Y., and He Y. A new fault dictionary method for fault diagnosis of analog circuits. Microelectronics 31 4 (2001) 252-254 (in Chinese).
    • (2001) Microelectronics , vol.31 , Issue.4 , pp. 252-254
    • Tan, Y.1    He, Y.2
  • 5
    • 34548278567 scopus 로고    scopus 로고
    • Fault dictionary method in analog circuits based on node voltage sensitivity weight sequence
    • (in Chinese).
    • Zhang W., Xu A., and Chen Z. Fault dictionary method in analog circuits based on node voltage sensitivity weight sequence. Journal of Electronic Measurement and Instrument 20 4 (2006) 46-49 (in Chinese).
    • (2006) Journal of Electronic Measurement and Instrument , vol.20 , Issue.4 , pp. 46-49
    • Zhang, W.1    Xu, A.2    Chen, Z.3
  • 6
    • 27644521026 scopus 로고    scopus 로고
    • A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math
    • Wang P., and Yang S. A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math. IEEE Trans. on Circuits and Systems-I: Regular Papers 52 10 (2005) 2118-2127
    • (2005) IEEE Trans. on Circuits and Systems-I: Regular Papers , vol.52 , Issue.10 , pp. 2118-2127
    • Wang, P.1    Yang, S.2
  • 7
    • 7744235565 scopus 로고    scopus 로고
    • A new fault dictionary method enable to diagnose soft fault of tolerance analog circuits
    • (in Chinese).
    • Chen S., Hong B., Wang Y., et al. A new fault dictionary method enable to diagnose soft fault of tolerance analog circuits. Chinese Journal of Electronics 28 2 (2000) 127-129 (in Chinese).
    • (2000) Chinese Journal of Electronics , vol.28 , Issue.2 , pp. 127-129
    • Chen, S.1    Hong, B.2    Wang, Y.3
  • 8
    • 0037311715 scopus 로고    scopus 로고
    • Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces
    • Czaja Z., and Zielonko R. Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces. IEEE Transactions on Instrumentation and Measurement 52 1 (2003) 97-102
    • (2003) IEEE Transactions on Instrumentation and Measurement , vol.52 , Issue.1 , pp. 97-102
    • Czaja, Z.1    Zielonko, R.2
  • 10
    • 34047202462 scopus 로고    scopus 로고
    • Yuan Haiying, Chen Guangju, Shi Sanbao, et al. Research on fault diagnosis in analog circuit based on wavelet-neural network. In: Proceeding of WCICA 2006, The 6th World Congress on Intelligent Control and Automation, Dalian, China, 2006, 1: 2659-2662.
  • 11
    • 27944510621 scopus 로고    scopus 로고
    • He Yigang, Li Yun, Liu Meirong. BP neural network approach to module fault diagnosis for large analog circuit. In: Proceeding of TENCON 2004. IEEE Region 10 Conference, 2004, 4: 395-398.
  • 12
    • 33845935566 scopus 로고    scopus 로고
    • Sergey G M. Neural network-based technique for detection catastrophic and parametric faults in analog circuits. In: Proceeding of the 18th International Conference on Systems Engineering, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.