Fault detection for linear analog IC - The method of short-circuit admittance parameters

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 49, Issue 1, 2002, Pages 105-108

  Li, Feng ^a   Woo, Peng Yung ^b  

^a FUDAN UNIVERSITY   (China)

^b NORTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

Fault detection; Parameter tolerance; Short circuit admittance parameters

Indexed keywords

ERROR ANALYSIS; FAILURE ANALYSIS; MATRIX ALGEBRA; SHORT CIRCUIT CURRENTS; VOLTAGE MEASUREMENT;

ANALOG CIRCUITS; CIRCUIT AUTOMATIC DETECTING EQUIPMENT; FAULT DETECTION; PARAMETER TOLERANCE; SHORT CIRCUIT ADMITTANCE PARAMETERS;

LINEAR INTEGRATED CIRCUITS;

EID: 0036118268     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.974884     Document Type: Article

References (9)

1. An application of inverse probability to faults isolation
2. Fault analysis of analog circuits
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4. Fault diagnosis of linear analog networks: A theory and its implementation
5. Fault analysis of nonlinear circuits from node voltage measurement
6. The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method
7. Fault detection method for the sub-circuits of a cascade linear circuit
8. Detection of catastrophic faults in analog integrated circuits