Carbon nanowires spontaneously formed on surface of freshly cleaved highly ordered pyrolytic graphite wafer

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 8 B, 2007, Pages 5568-5571

  Guo, Xinli ^a   Fujita, Daisuke ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Atomic force microscopy (AFM); Carbon nanowire; Highly ordered pyrolytic graphite (HOPG); Scanning electron microscopy (SEM); Scanning tunneling microscopy (STM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE DEFECTS;

AMETALLIC CONDUCTIVITY; HIGHLY ORDERED PYROLYTIC GRAPHITE (HOPG);

NANOWIRES;

EID: 34548279400     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.5568     Document Type: Article

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